Channeling 2018

Session

S4.1 Charged Beams Shaping & Diagnostics

Sep 25, 2018, 11:20 AM

Conveners

S4.1 Charged Beams Shaping & Diagnostics

• Alexander Potylitsyn (Tomsk Polytechnic University)

180. Optical Cherenkov Diffraction Radiation as a Tool for Non-invasive Charged Particle Beam Diagnostics

Dr Pavel Karataev (Royal Holloway, Unviersity of London)

9/25/18, 11:20 AM

Oral presentation

Transverse beam diagnostics is a key sub-system in any accelerator facility enabling to evaluate its performance. Invasive techniques such as optical transition radiation (OTR) or wire scanners are not good enough because high power beam can destroy the OTR target or a thin wire so quickly that the diagnostics equipment will become useless for a long period of time required to repair it....

153. A Simple Model to Describe Smoke Ring Shaped Beam Profile Measurements with Scintillating Screens at the European XFEL

Dr Gero Kube (Deutsches Elektronen-Synchrotron (DESY))

9/25/18, 11:50 AM

Oral presentation

Standard beam profile measurements of high-brightness electron beams based on optical transition radiation (OTR) may be hampered by coherence effects induced by the micro-bunching instability which render a direct beam imaging impossible. For the European XFEL it was decided to measure transverse beam profiles based on scintillating screen monitors using LYSO:Ce as scintillator material....

32. Diffraction Radiation for 2D Transverse Beam Size Diagnostics

Dr Alexey Tishchenko (National Research Nuclear University "MEPhI")

9/25/18, 12:05 PM

Oral presentation

In this report, we suggest a new type of target capable of advanced beam diagnostics. The target is a screen with 5 holes in it: one in the centre and 4 are at the corners of a rectangle. As the rectangle’s sides differ, the radiation will contain information about two beam sizes, which opens the possibility to detect two transversal beam sizes simultaneously. To describe the radiation we...

140. Evolution of the Landau Spectral Peak Produced by 50 GeV Protons and 7 GeV Electrons in Si Detector at Rotation of the Detector

Mr Ramazan Nazhmudinov (Belgorod National Research University)

9/25/18, 12:20 PM

Oral presentation

The spectra of ionization loss of 50 GeV protons and 7 GeV electrons in 131 and 300 μm thick silicon detector [1,2] at different alignments of the detector are presented. The thickness of the depleted zone of the semiconductor detector Hamamatsu S3590-18 was 131 μm at 10 V and 300 μm at 100 V power supply. Spectra of ionization loss were measured at different angles of the detector rotation...

91. Orientation Effect in the Neutron Yield in Deuterated Pd Target Bombarded by Deuterium Ion Beam

Dr Alexey Rusetskii (P.N. Lebedev Physical Institute Russian Academy of Sciences)

9/25/18, 12:35 PM

Oral presentation

O.D. Dalkarov a, M.A. Negodaev a, A.S. Rusetskii a, A.P. Chubenko a, Yu.L.Pivovarov b, T.A.Tukhfatullin b a P.N. Lebedev Physical Institute Russian Academy of Sciences (LPI), Moscow, Russia b National Research Tomsk Polytechnic University, Tomsk, Russia At the ion accelerator HELIS at the LPI, the neutron yield is investigated in DD reactions in deuterated Pd target, during an...

85. Crystal Optical Solution for Generation of High Energy Neutrino Beams

Dr Vladimir Maisheev (Institute for High Energy Physics)

9/25/18, 12:50 PM

Oral presentation

The problem of creation of high energy neutrino beams on the basis of modern and future circular proton accelerators with the help of traditional technology seems to be expensive and difficult. Because of this, we propose the solution of this problem based on the usage of focusing bend single crystals. In the report we demonstrate the possibilities of acceptance and focusing of a pion beam...