21–25 May 2007
Laboratori Nazionali di Frascati dell'INFN
Europe/Rome timezone

KLOE measurements of the charged Kaon lifetime and BR(K+ into pi+ pi0)

21 May 2007, 18:50
20m
High Energy Building - Aula Bruno Touschek (Laboratori Nazionali di Frascati dell'INFN)

High Energy Building - Aula Bruno Touschek

Laboratori Nazionali di Frascati dell'INFN

Via E. Fermi, 40 00044 Frascati
Vus and Vud Session I

Speaker

Paolo Massarotti (Naples University & INFN)

Description

The charged K lifetime, is an experimental input to the determination of Vus. The present fractional uncertainty is about 0.2%, however the available data show large discrepancies between the measurements done using charged kaon decays in-flight and at-rest. At KLOE two different methods have been developed: one based on the measurement of the charged kaon decay length and the other based on its decay time. Both methods allow us to reach accuracies at the few per mil level. These two independent methods allow us to assess part of the systematic uncertainty. Efficiency and resolution functions are measured directly on data using an independent control sample. The measurement of the charged kaon lifetime will be presented. A new precise measurement of the absolute BR(K+ -> pi pi0 (gamma)) has an important impact on the world average of the charged kaon semileptonic BR's, because of the NA48, ISTRA+ and E865 experiments that use the pi pi0 decay in the normalization sample. A pure K+ beam is tagged at KLOE by the recostruction of the K- -> mu nu decays. The signal counting is given by a fit to the distribution of the momentum of the charged decay particle in the kaon rest frame assuming the pion mass. The shapes of the signal and of the backgrond (mu nu and 3 bodies decays) are obtained from data control samples and MC. Efficiency is measured directly on data using an independent control sample. The measurement of the BR(K+ -> pi pi0 (gamma)) will be presented.

Primary author

Collaboration KLOE

Presentation materials